
View the NIWeek 2008 Final Program
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Worldwide Graphical System Design Conference and Exhibition
August 5-7, 2008 - Austin Convention Center, Austin, Texas
National Instruments invites you to join our community of engineers, scientists, and educators from all over the world. NIWeek 2008 features three full days of interactive technical sessions, exhibitions, and workshops on the latest developments for automation, manufacturing, design, and test. The conference provides in-depth content presented by leading industry experts in these dynamic areas.

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NIWeek 2008 Featured Sessions
Upgrading Your LabVIEW Application
NI engineers demonstrate the process of upgrading customer-submitted applications and give a short presentation on the upgrade process for each application, potential issues that may arise, and techniques used to solve each issue.
NI is accepting applications for code to be upgraded in this session.
Mechatronics Considerations for Assisting Humans
Explore the concept of smart shoes that measure the distribution of foot pressures for phase estimation in a human gait and detection of abnormalities. Based on the estimated phase, a control algorithm is adapted for the most effective assistance to the user.
Presented by University of California, Berkeley within the Embedded Design Track
Optimizing Automated Test Systems with Parallel Technologies
Learn how to use parallel technologies such as multicore processors, pipelining, and autoscheduling to optimize the execution of your automated test system. Take advantage of multicore processors to optimize processor-intensive tasks while using autoscheduling to increase the performance of instrumentation intensive tests.
Presented by National Instruments within the Software Development Techniques Track
Identifying the Ideal Digital I/O Hardware for High-Speed Applications
Applications requiring high-speed digital signals vary, including the implementation of standard or custom communication protocols, ASIC functional test, or high-speed digital video streaming. Explore some of these applications, identifying the appropriate hardware and software combinations from the National Instruments product lines.
Presented by National Instruments within the Test and Data Acquisition Track
NIWeek 2008 Sponsors
NIWeek 2008 Sponsors